Our lab has the following facilities：

•  Oxide molecular beam epitaxy (OMBE) system
•  Angle-resolved photoemission spectroscopy (ARPES) system
•  Four-circle high resolution x-ray diffractometer  (Bruker D8 discover)
•  Table-top magnetron sputtering system  (MTI)
•  Atomic force spectroscopy (AFM) 
•  Tube funance  (MTI)
•  In situ Hall and MOKE system (under construction)

OMBE+ARPES:

•  OMBE is an advanced thin film growth technique allowing the layer-by-layer growth of epitaxial oxide thin films and interfaces with atomic precision 
•  ARPES is a state-of-art tool to directly measure the electronic structure of materials
•  Through the integration of OMBE and ARPES in ultra-high vacuum condition, we can artificially build complex oxide films&interfaces and study the quantum phenomena in them

Four-circle  high resolution x-ray diffractometer  (Bruker D8 discover)

The high performance XRD system provides efficient and damage-free information about the phases and structures  of single crystal materials.

•  Multiple functions including X-ray diffraction, X-ray reflectivity, in-plane scan and alternating temperature scan (-100 to 350℃）, etc.
•  One-dimensional linear detector enables fast reciprocal space mapping
•  System open to all members in the college after training